Field Screening of Bread Wheat for Partial Sources of Resistance to Stem Rust
Abstract
156 words
The stem rust Puccinia graminis tritici race ug99 (TTKSK)
and its variants results into wheat grain losses ranging from 70-
100%. This study was set up at the Kenya Agricultural
Research Institute (KARI), Njoro to identify sources of partial
resistance to stem rust in Kenya. Twenty five wheat lines
selected from 2008 international wheat screening nursery were
grown in two replicates and screened for two seasons
(December 2009 to March 2010 and then June to October
2010). Final rust severity (FRS), area under the disease
progress curve (AUDPC) and the coefficient of infection (CI)
were used to assess these lines for resistance. The wheat lines
showed diversity in their responses ranging from trace to
susceptibility. The line R07F4-21258 showed small chlorotic
flecks and had no stem lodging. The entries 2, 3 and 20 had the
least ACI, rAUDPC and rFRS values. These elite entries had
the pseudo black potential sources of partial resistance to stem
rust.
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